Symrise and Cutech receive European patent for skin model


Claimed to bridge gap between in vitro and in vivo testing

Symrise AG and Italy’s Cutech Srl have received an European patent for their jointly developed ex vivo real skin model, said to bridge the gap between in vitro and in vivo testing.

According to Symrise, the requirements and economic parameters involved in developing and marketing new products are continually changing, making it important to demonstrate the mechanisms and efficacy of new products, before starting expensive, complex clinical testing.

For this reason, Symrise and Cutech established a joint research alliance, the result of which is claimed to be one of the most comprehensive ex vivo human skin models to date. While traditional skin models only comprise the epidermis and dermis, the new model also includes subcutaneous tissue and hair follicles, offering greater efficiency and additional testing possibilities – more accurate predictions of long-terms effects in humans, for example.

The new model expands the methods available for skin and hair follicle tests that Symrise and Cutech use for product development. In addition, a screening service offered by both companies for in vitro and ex vivo testing methods, called SCoutech, means other companies can utilise the model for their own developments.

“We have always been convinced that a key competitive factor is the development of the most appropriate screening technologies,” comments Cutech ceo Paolo Pertile. “With this project, by taking advantage of our experience with skin tissue engineering we have set up a preclinical screening model which we consider to be the most representative of the in vivo environment.”

Senior vp, Life Essentials at Symrise, Gabriele Vielhaber adds: “Together with Cutech, we have developed a reliable testing procedure for ingredients and formulas. Using this, downstream clinical testing can be targeted more accurately. SCoutech customers receive relevant results quickly and efficiently.”

Featured Companies

See also