Lower power X-ray enables faster throughput

Published: 3-Jun-2007

S+S Inspection Limited has launched a new product inspection system offering a lower power X-ray source providing enhanced image processing at higher throughput speeds.

S+S Inspection Limited has launched a new product inspection system offering a lower power X-ray source providing enhanced image processing at higher throughput speeds.

The Raycon system detects both metallic and non-metallic product contamination and identifies missing, broken or underweight products. S+S offers four models to accommodate products both small and large in size.

The X-ray product is designed with a stainless steel housing and features a built-in touch-screen LCD monitor for image inspection and machine set-up and operation.

With its design specific for final inspection of packaged products, the machine can also inspect aluminium coated or metallic film packaging. The product also detects a range of non-metallic materials including glass, ceramics, stones, rubber, bone and some plastics.

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